X-MET5100 Hand-held XRF Analyser
Oxford Instruments' portable XRF (X-ray fluorescence) analysers
X-MET5100 and X-MET5000:
- For fastest scrap metal sorting and analysis (often called a ‘metal analysis gun’)
- For high speed PMI (Positive Material Identification) and QC/QA
- For fast and reliable compliance screening of restricted elements ('elemental analyser')
- For high speed reliable mine mapping and on-site ore analysis
- For fast on-site heavy metal analysis of soils ('soil analyser')
X-MET5000 and X-MET5100 multi-element X-ray fluorescence (XRF) analysers are engineered to deliver unparalleled speed and measurement accuracy for high throughput, real-time results that can be trusted.
These highly productive mobile testing tools – indispensable for metals, plastics, electronics and wood recycling – can for the first time also separate 6061/6063 alloys without the need for vacuum or helium attachments. The X-MET5100 with its Light Element capability enables more accurate and rapid aluminium grade identification. It also provides the scrap recycling industry confidence to accurately identify and analyze nickel, copper and ferrous materials that may contain large amounts of light elements such as aluminium, silicon or phosphorus.
X-MET hand-held XRF analysers are specifically designed for:
- positive material identification (PMI)
- metal identification/scrap sorting
- analysis of alloys and hazardous material analysis (RoHS screening)
- analysis of heavy metals in soils on polluted lands and ores at mining sites
- screening for lead in toys
- detection of lead in paint
Extensive and open grade library
The X-MET allows easy easy editing of the grade libraries, including the addition of new alloys and naming of alloys. The integrated grade library contains:
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Nickel Alloys, Stainless Steels, Cobalt Alloys, Low Alloy Steel, Tool Steels, Copper Alloys, Titanium Alloys, Zirconium Alloys, Aluminium Alloys
The X-MET is capable of storing thousands of grade identifications and it’s easy to add new elements or to create a custom library.
The top of the range X-MET5100 combines Oxford Instruments’ groundbreaking Silicon Drift Detector (SDD) with a powerful 45kV X-ray tube. This cutting edge technology delivers a five times faster measurement speed, much better detection limits and significant accuracy improvement over conventional systems.
Isn’t it time you used X-MET to improve your productivity?