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X-Strata 980 is a cost-effective solution for the process and quality control of thin-film photovoltaic cells. It is a high performance, micro-spot, bench-top energy dispersive X-ray fluorescence spectrometer for the determination of multi-layer coating thickness and composition analysis on small analysis areas. It conforms to test methods ISO 3497, ASTM B568 and DIN 50987. |
The system has as its source of excitation a field-proven, 100-watt, Oxford Instruments micro-focus X-ray tube, and is fitted with a high-performance, peltier-cooled Si-PIN-diode detector. This combination provides outstanding precision and low limits of detection, even at short measurement times. Coating thickness and composition results are obtained within seconds.
There is no sample preparation required. It is simply a question of placing the sample in the X-Strata's large analysis chamber, use the focus laser to achieve the correct focal distance, and click on the 'Go' button to start the measurement.
It enables rapid analysis of layer thickness and composition of the cells and can be part of a pass/fail decision process, ensuring that produced parts meet specification, thereby providing the required efficiency of conversion of solar energy into electricity.
The X-Strata980’s simple user interface ensures that it can be operated by any staff, in a lab as well as along the manufacturing line.